EE Faculty Colloquium on Learning from unreliable data
EE, MMCRSpeaker: Prof. P.S. Sastry, Dept of Electrical Engineering, Indian Institute of Science Abstract: Supervised learning of classifiers is widely used in many applications of AI/ML. The deep networks used in such applications today need a large training set. Creating a labelled data set where one can have high confidence in the labels is both expensive […]